Next generation precision electronic instruments are using higher input and output sampling frequencies, while evolving air interfaces place increasing performance and low power demands on data converters. Synchronized serial digital data interfaces are the key for tomorrow's data acquisition applications - helping to simplify your design, reduce board space and improve conversion performance.
The JEDEC JESD204A high-speed serial interface option included in our data converter portfolio meets these important system design requirements. Furthermore, NXP assures interoperability with SERDES-based FPGAs from Altera, Lattice and Xilinx, when used with the JESD204A IP blocks sourced from these suppliers. So you can now fast track your designs for communications, instrumentation, medical and aerospace systems.
The optimal balance between linearity and power dissipation
Our conversion solutions deliver wide analog bandwidth and an optimal balance between linearity and power dissipation. This ensures the best possible signal fidelity in both receive and transmit paths between the antenna and the digital baseband processor in wireless infrastructure equipment.
To improve ease-of-use in light of increasing design complexity, NXP has worked with key base station OEMs and other partners to develop the JESD204A standard. The JESD204A interface has several technical merits, including the use of 8B / 10B coding which yields a DC balanced signal (allowing the data transmission line to be ac-coupled capacitively, inductively or optically), and in-band control characters to establish and maintain lane synchronization. JESD204A includes an optional data scrambling protocol which can reduce or eliminate spurs in the analog spectral domain caused by periodic digital data patterns.
Improve data acquisition while keeping RF and digital circuitry securely isolated
In our advanced DACs and ADCs, the serial digital signals on the JESD204A lanes are optionally scrambled and sample-synchronized irrespective of physical length. This enables new system architectures in which the RF circuits are securely isolated from the digital circuits while maintaining high data acquisition performance.
In addition to outstanding performance, aerospace applications require extended environmental operating robustness. NXP has proven capabilities in extended temperature ceramic package device characterization and qualification, and can offer radiation hardened (rad hard) qualification services to aerospace customers.
Keep your images free from noise and enhance cost competitiveness
Medical imaging applications are typically judged by image quality and the speed at which images are generated. Dynamic range and signal-to-noise ratio are the fundamental quality metrics in these systems. Ideal for demanding medical imaging, NXP's high-speed data converters combine high SFDR / SNR, support for high input frequencies and sampling rates, with high functional integration and low power dissipation.
Serial interface data converters reduce development cost and BOM cost without sacrificing analog performance. JESD204A-based converters enable higher converter density on a fixed-sized PCB, due to the smaller device package size and relaxed routing constraints enabled by this new industry standard. Thus higher capability next generation medical imaging equipment can be offered in current form factor enclosures.
Maximize dynamic range across all your operating temperatures
The exceptional dynamic performance, low power dissipation, optional input buffer and multi-lane JESD204A-compliant data interface is a unique and powerful combination of features for the diverse industrial and instrumentation equipment application segments.
NXP's new ADCs and DACs include an embedded and user-transparent self-calibration scheme that ensures a maximum 2 dB SFDR fluctuation across operating temperature (-40°C to +85°C). The DAC1408D also supports the optional JESD204A MDS feature, enabling data streams from several DACs to be sample synchronized and phase coherent. Among other benefits, this simplifies development of quadrature sampling test equipment.
